Fan-Out Panel-Level PCB-Embedded SiC Power MOSFETs Packaging

被引:29
|
作者
Hou, Fengze [1 ,2 ,3 ]
Wang, Wenbo [4 ]
Ma, Rui [1 ,3 ]
Li, Yonghao [5 ]
Han, Zhonglin [1 ]
Su, Meiying [1 ,3 ]
Li, Jun [1 ,3 ]
Yu, Zhongyao [1 ,3 ]
Song, Yang [1 ,3 ]
Wang, Qidong [1 ,3 ]
Chen, Min [5 ]
Cao, Liqiang [1 ,3 ]
Zhang, Guoqi [2 ]
Ferreira, Braham [6 ,7 ]
机构
[1] Chinese Acad Sci, Inst Microelect, Beijing 100029, Peoples R China
[2] Delft Univ Technol, Dept Microelect, NL-2628 Delft, Netherlands
[3] Natl Ctr Adv Packaging, Wuxi 214135, Jiangsu, Peoples R China
[4] Shenzhen Inst Wide Bandgap Semicond WinS, Shenzhen 518055, Peoples R China
[5] Zhejiang Univ, Coll Elect Engn, Hangzhou 310027, Peoples R China
[6] Delft Univ Technol, Dept Elect Sustainable Energy, NL-2628 Delft, Netherlands
[7] Univ Twente, Dept Telecommun Engn, NL-7522 Enschede, Netherlands
基金
中国国家自然科学基金;
关键词
Electro-thermo-mechanical codesign; printed circuit board (PCB)-embedded package; phase-leg silicon carbide (SiC) metal-oxide-semiconductor field-effect transistor (MOSFET) power module; static characterization; switching characterization; RELIABILITY; ELECTRONICS; WARPAGE;
D O I
10.1109/JESTPE.2019.2952238
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this article, a novel fan-out panel-level printed circuit board (PCB)-embedded package for phase-leg silicon carbide (SiC) metal-oxide-semiconductor field-effect transistor (MOSFET) power module is presented. Electro-thermo-mechanical co-design was conducted, and the maximum package parasitic inductance was found to be about 1.24 nH at 100 kHz. Compared with wire-bonded packages, the parasitic inductances of the PCB-embedded package decreased at least by 87.6%. Compared with blind via structure, the thermal resistance of the proposed blind block structure reduced at most by about 26%, and the stress of the SiC MOSFETs decreased by about 45.2%. Then, a novel PCB-embedded packaging process was developed, and three key packaging processes were analyzed. Furthermore, effect of PCB-embedded package on static characterization of SiC MOSFET was analyzed, and it was found that: 1) Output current of PCB-embedded package was decreased under a certain gate-source voltage compared to SiC die; 2) Miller capacitance of SiC MOSFET was increased thanks to parasitic capacitance induced by package; and 3) compared with SiC die, nonflat miller plateau of the PCB-embedded package extends, and as drain-source voltage increases, the nonflat miller plateau extends. Lastly, switching characteristics of the PCB-embedded package and TO-247 package were compared. The results show that the PCB-embedded package has smaller parasitic inductances.
引用
收藏
页码:367 / 380
页数:14
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