Self-ordering of CoSi2 precipitates and epitaxial layer growth of CoSi2 on Si(100)

被引:2
作者
Mantl, S [1 ]
Hacke, M [1 ]
Bay, HL [1 ]
Kappius, L [1 ]
Mesters, S [1 ]
机构
[1] Forschungszentrum Julich, Inst Schicht & Ionentech, D-52425 Julich, Germany
关键词
self-ordering; molecular beam epitaxy; epitaxial silicides;
D O I
10.1016/S0040-6090(98)00482-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper we present recent investigations on the growth of buried single crystalline CoSi2 layers in Si(100) by molecular beam allotaxy. By this growth method the layer formation takes place during a rapid high temperature anneal of silicide precipitates embedded in the Si(100) matrix. During the anneal the precipitates coarsen and coalesce into a uniform layer. The results show that, under certain conditions, self-ordering of the precipitates evolves during the anneal in accordance with recent computer simulation. (C) 1998 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:251 / 255
页数:5
相关论文
共 18 条