Pitfalls of accelerated testing

被引:52
|
作者
Meeker, WQ [1 ]
Escobar, LA
机构
[1] Iowa State Univ, Dept Stat, Ames, IA 50011 USA
[2] Louisiana State Univ, Dept Expt Stat, Baton Rouge, LA 70803 USA
[3] Iowa State Univ, Ctr Nondestruct Evaluat, Ames, IA 50011 USA
基金
美国国家科学基金会;
关键词
Arrhenius; censored data; degradation; masked failure mode;
D O I
10.1109/24.722271
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
Accelerated tests are used to obtain timely information on product-life or performance-degradation over time. Test units are used more frequently than usual or are subjected to higher than usual levels of accelerating variables like temperature & voltage. Then the results are used, through an appropriate physically-based statistical model, to make predictions about product life or performance over time, at the more moderate use-conditions. The extrapolative predictions inherent in the use of accelerated testing raise serious concerns, and the use of accelerated testing has many dangerous pitfalls. This paper warns potential users about some of these pitfalls.
引用
收藏
页码:114 / 118
页数:5
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