Thermally induced surface instabilities in polymer light emitting diodes

被引：7

作者：

Akande, Wali O. ^{[1
,2
]}

Akogwu, Onobu ^{[1
,3
]}

Tong, Tiffany ^{[1
,2
]}

Soboyejo, Wole ^{[1
,3
]}

机构：

[1] Princeton Univ, Princeton Inst Sci & Technol Mat, Princeton, NJ 08544 USA

[2] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA

[3] Princeton Univ, Dept Mech & Aerosp Engn, Princeton, NJ 08544 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2010年 / 108卷 / 02期

基金：

美国国家科学基金会;

关键词：

THIN-FILMS; BLACK SPOTS; DEGRADATION; FAILURE; SPECTROSCOPY;

D O I：

10.1063/1.3448035

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The role of thermal gradients and their attendant mechanical stresses in the overall stability of organic electronic devices has been elucidated through the occurrence of spiral shaped blisters that develop on the surface of suitably biased polymer light emitting diodes. A model based on the spontaneous disordering (or ordering) of polymeric thin film systems has been used to explain the formation and growth of these blisters. The model is shown to provide insights into how thermal stresses affect the overall stability of organic electronic devices. The implications of the results are then discussed for the design of flexible organic electronic devices. (C) 2010 American Institute of Physics. [doi:10.1063/1.3448035]

引用

页数：6

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