共 50 条
- [21] Group refractive index of fused silica and white-light spectral interferometry with a dispersive Michelson interferometer OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION II: APPLICATION IN INDUSTRIAL DESIGN, 2001, 4398 : 229 - 237
- [22] Nanometrology based on white-light spectral interferometry in thickness measurement - art. no. 683108 NANOPHOTONICS, NANOSTRUCTURE, AND NANOMETROLOGY II, 2008, 6831 : 83108 - 83108
- [23] White-Light Frequency-Domain Interferometry Using a Köosters Prism Optical Review, 1998, 5 : 21 - 26
- [25] Measuring distances and displacements by an interferometric technique using a low-resolution miniature fiber optic spectrometer OPTICAL TECHNIQUES FOR ENVIRONMENTAL SENSING, WORKPLACE SAFETY, AND HEALTH MONITORING, 2002, 4887 : 77 - 88
- [26] Thickness of SiO2 thin film on silicon wafer measured by dispersive white-light spectral interferometry Applied Physics B, 2006, 84 : 511 - 516
- [27] High spectral range, high speed fiber optic spectrometer OPTIK, 2015, 126 (15-16): : 1419 - 1422
- [29] Robust Vertical Scanning White-light Interferometry in Close-to-Machine Applications OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION IX, 2015, 9525
- [30] White-light spectral interferometric technique used to measure the dispersion of the group birefringence of a uniaxial crystal Optical Measurement Systems for Industrial Inspection IV, Pts 1 and 2, 2005, 5856 : 410 - 418