Phase-Diffusion in Switching Process of Underdamped Josephson Junctions

被引：1

作者：

Tan, Xinsheng ^{[1
,2
]}

Cong, Shanhua ^{[3
]}

Pan, Cheng ^{[1
,2
]}

Yu, Yang ^{[1
,2
]}

Sun, Guozhu ^{[3
]}

Chen, Jian ^{[3
]}

Wu, Peiheng ^{[3
]}

机构：

[1] Nanjng Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China

[2] Nanjng Univ, Sch Phys, Nanjing 210093, Peoples R China

[3] Nanjing Univ, Sch Elect Sci & Engn, Res Inst Superconductor Elect, Nanjing 210093, Peoples R China

来源：

IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY | 2011年 / 21卷 / 03期

关键词：

Crossover temperature; multi-retrapping model; phase-diffusion; thermal activation; ZERO-VOLTAGE STATE;

D O I：

10.1109/TASC.2010.2093857

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We measured the switching from a superconducting state to a finite voltage state in a dc SQUID, which is equivalent to a single Josephson junction with tunable critical current. The width and the mean of the switching current distribution depend on the effective temperature T(eff) and I(c). The phase-diffusion was observed by investigating the switching current distribution as a function of T(eff). It is found that the crossover from the thermal activation to the phase-diffusion scaling with the ratio of I(c) and T(eff), clarifying the physical picture of the phase-diffusion. We developed an analytical multi-retrapping model which can address the experimental results very well.

引用

页码：436 / 439

页数：4