Ferromagnetic resonance study of sputtered Pt/Co/Pt multilayers

被引：9
|
作者：
Neilinger, P. [1 ]
Scepka, T. [2 ]
Mruczkiewicz, M. [2 ]
Derer, J. [2 ]
Manca, D. [1 ,3 ]
Dobrocka, E. [2 ]
Samardak, A. S. [4 ,5 ]
Grajcar, M. [1 ,3 ]
Cambel, V. [2 ]
机构：
[1] Comenius Univ, Dept Expt Phys, Bratislava 84248, Slovakia
[2] SAS, Inst Elect Engn, Dubravska Cesta 9, Bratislava 84104, Slovakia
[3] SAS, Inst Phys, Dubravska Cesta 9, Bratislava 84104, Slovakia
[4] Far Eastern Fed Univ, Sch Nat Sci, Vladivostok 690950, Russia
[5] Natl Res South Ural State Univ, Chelyabinsk 454080, Russia
来源：
APPLIED SURFACE SCIENCE | 2018年 / 461卷
关键词：
Ferromagnetic resonance; g-factor; Gilbert damping; Nano-layers; Surface anisotropy; Co/Pt multilayers; PERPENDICULAR MAGNETIC-ANISOTROPY;
D O I：
10.1016/j.apsusc.2018.06.172
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
We report on broadband ferromagnetic resonance studies of [Pt-tPt/Co-tCo/Pt-tPt](N) multilayer thin films, using a flip-chip method with a high frequency coplanar waveguide at room temperature. We investigate the dependence of the magnetic parameters of thin films, namely the Gilbert damping constant alpha, the effective magnetization M-eff and Lande g-factor on both the Pt layer thickness (0.9 nm <= t(Pt) <= 2.7 nm) and the thickness of the Co layers (1.2 nm <= t(Co) <= 11.3 nm). Moreover, the effect of different stacking numbers N on the film parameters is studied.
引用
收藏
页码：202 / 205
页数：4
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