Writing and detecting bits at 100 Gbit/in2 in longitudinal magnetic recording media

被引：25
|
作者：
Moser, A
Rettner, CT
Best, ME
Fullerton, EE
Weller, D
Parker, M
Doerner, MF
机构：
[1] IBM Corp, Almaden Res Ctr, San Jose, CA 95120 USA
[2] IBM Corp, Storage Syst Div, San Jose, CA 95193 USA
来源：
IEEE TRANSACTIONS ON MAGNETICS | 2000年 / 36卷 / 05期
关键词：
magnetic recording; high density recording; narrow track; write head; magnetic force microscopy; focused ion beam; bit aspect ratio;
D O I：
10.1109/20.908333
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We have written bits in longitudinal media at extremely high areal densities, >100, using a focused ion beam (FIB) trimmed write head mounted on a static write/read tester. Bits were written at a track pitch of similar to 100 nm and with a 62.5 transition spacing with the same trimmed write head. The bits were characterized with the head read sensor and also with magnetic force microscopy (MFM). The MFM images were analyzed with respect to transition position jitter, signal-to-noise, and track width.
引用
收藏
页码：2137 / 2139
页数：3
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