Improving the Stability of R2R Printed 1-Bit Code Generator through Spin-Coated Multilayer-Encapsulation Method

Roll-to-roll (R2R) printed electronic devices have great advantages for developing large scale flexible and disposable devices when compared to current Si-based technology. For practical realization of these advantages, however, R2R printed devices need to surmount device functionality limitations, most urgently high-power dissipation and poor device stability. To resolve both imperative challenges at once, herein, an all R2R printed complementary metal-oxide-semiconductor (CMOS) 1-bit code generator with spin-coated multilayer encapsulation method is developed. In order to print CMOS devices by an all-R2R gravure printing method, electrical amphoteric property of the single walled carbon nanotube (SWCNT) is utilized to fabricate both p-type and n-type SWCNT based thin film transistors (TFTs). In addition, printable encapsulating polymeric materials (CYTOP and FG-3650) are developed to effectively prevent H2O permeation. The resulting CMOS 1-bit code generator is able to continuously operate for 2 h under ambient conditions without any variation in output voltage and frequency.