A comparison of redundant inverter topologies to improve voltage source inverter reliability

被引：71

作者：

Julian, Alexander L. ^{[1
]}

Oriti, Giovanna ^{[1
]}

机构：

[1] Naval Postgrad Sch, Dept Elect & Comp Engn, Monterey, CA 93955 USA

来源：

IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS | 2007年 / 43卷 / 05期

关键词：

mean time between failure (MTBF); redundancy; reliability; voltage-source inverter (VSI);

D O I：

10.1109/TIA.2007.904436

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

For applications sensitive to reliability, typical voltage-source inverters (VSIs) cannot always meet the reliability requirements. In these cases, some method of redundancy is used to improve system reliability. This paper compares the reliability of two redundant VSI circuit topologies to a typical VSI circuit. The redundant circuits function normally after the failure (open or short) of any single component, including the controller, current and voltage sensors, capacitors, insulated gate bipolar transistors, and power diodes. The parts count method of reliability comparison that is described in MIL-HDBK-217F is used to compare the reliability functions for the three circuit topologies.

引用

页码：1371 / 1378

页数：8

共 9 条

[1]

[Anonymous], MILSTD1399

[2]

De Pra U., 1998, PROC 20 INT TELECOMM, P543, DOI [10.1109/INTLEC.1998.793592, DOI 10.1109/INTLEC.1998.793592]

[3]

*DEPT DEF, 1995, MILHDBK217F DEPT DEF

[4]

*DEPT DEF, 1998, MILHDBK338B DEPT DEF

[5]

DOISHITA K, 1999, P INTELEC JUN 6 9, P11

[6] A novel clamp circuit for a regenerative rectifier using AC/AC matrix converter theory [J].

Julian, AL ;

Oriti, G .

IEEE TRANSACTIONS ON INDUSTRY APPLICATIONS, 2005, 41 (01) :68-74

[7] Investigation of fault modes of voltage-fed inverter system for induction motor drive [J].

Kastha, Debaprasad ;

Bose, Bimal K. .

IEEE Transactions on Industry Applications, 1994, 30 (04) :1028-1038

[8]

Klug RD, 2003, 2003 IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL TECHNOLOGY, VOLS 1 AND 2, PROCEEDINGS, P636

[9] Method to increase reliability in 5-level inverter [J].

Rodríguez, J ;

Hammond, P ;

Pontt, J ;

Musalem, R .

ELECTRONICS LETTERS, 2003, 39 (18) :1343-1345

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