共 50 条
- [22] Analysis of MEMS devices under temperature stress test 2021 IEEE 8TH INTERNATIONAL WORKSHOP ON METROLOGY FOR AEROSPACE (IEEE METROAEROSPACE), 2021, : 63 - 68
- [26] Changes in temperature field under external impact considering humidity 24TH INTERNATIONAL SYMPOSIUM ON ATMOSPHERIC AND OCEAN OPTICS: ATMOSPHERIC PHYSICS, 2018, 10833
- [29] Industry study on issues of MEMS reliability and accelerated lifetime testing 2005 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 43RD ANNUAL, 2005, : 312 - 316