Reliability Study of a MEMS Array Under Varying Temperature and Humidity

被引:0
|
作者
Sivakumar, Ganapathy [1 ]
Ranganathan, Ranjith [1 ]
Gale, Richard [1 ]
Dallas, Tim [1 ]
机构
[1] Texas Tech Univ, Dept Elect Eng, Lubbock, TX 79409 USA
来源
RELIABILITY, PACKAGING, TESTING, AND CHARACTERIZATION OF MEMS/MOEMS AND NANODEVICES IX | 2010年 / 7592卷
关键词
stiction; reliability; Weibull; humidity; self-assembled monolayer; MONOLAYER FILMS; STICTION; ADHESION;
D O I
10.1117/12.842384
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this work, we quantify and analyze the rate of accrual of stiction and mechanical fatigue in a MEMS micro-mirror device to understand its reliability under a set of controlled temperature and humidity splits. An accelerated aging system was employed by using a non-standard actuation procedure to more rapidly induce failure of the micro-mirrors. The array is hermetically packaged with a low surface energy self-assembled-monolayer (SAM) based anti-stiction coating, along with an encapsulated source of this anti-stiction coating that serves as a reservoir. Exposure of the micro-mirror array to the environmental conditions was made possible by drilling two 1 mm holes in the hermetic package. This enabled the retention of the encapsulated SAM source in the package which was vital to understanding the effects of SAM re-deposition on the surface in the operating environment. The fastest accrual of stiction was seen in the 90 degrees C, 80% RH split with approximately 80% of the micro-mirrors failing within 4.4 x 10(9) cycles (10 hours) with 2.7x10(-14) Joules of Stiction Equivalent Energy while the 60 degrees C, 20% RH showed the least stiction accrual rate with less than 2% failure for 2.26x10(12) cycles (1500 hours). The failure data obtained from the experiments were used to do a reliability analysis by utilizing the Weibull distribution.
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页数:9
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