Microstructure instability in cryogenically deformed copper

被引：37

作者：

Konkova, T. ^{[2
]}

Mironov, S. ^{[1
,2
]}

Korznikov, A. ^{[2
]}

Semiatin, S. L. ^{[3
]}

机构：

[1] Tohoku Univ, Dept Mat Proc, Grad Sch Engn, Sendai, Miyagi 9808579, Japan

[2] Russian Acad Sci, Inst Met Superplast Problems, Ufa 450001, Russia

[3] USAF, Res Lab, Mat & Mfg Directorate, AFRL RXLM, Wright Patterson AFB, OH 45433 USA

来源：

SCRIPTA MATERIALIA | 2010年 / 63卷 / 09期

关键词：

Cryogenic deformation; Electron backscatter diffraction; Copper; Nanocrystalline microstructure; PLASTIC-DEFORMATION;

D O I：

10.1016/j.scriptamat.2010.07.005

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

High-resolution electron backscatter diffraction was employed to establish the microstructural stability in severely cryodeformed copper during long-term static storage at room temperature. The material was shown to exhibit grain growth including some aspects of abnormal grain growth. (C) 2010 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：921 / 924

页数：4

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