Interscale mixing microscopy: numerically stable imaging of wavelength-scale objects with sub-wavelength resolution and far field measurements

被引：13

作者：

Inampudi, Sandeep ^{[1
]}

Kuhta, Nicholas ^{[2
]}

Podolskiy, Viktor A. ^{[1
]}

机构：

[1] Univ Massachusetts Lowell, Dept Phys & Appl Phys, Lowell, MA 01854 USA

[2] Oregon State Univ, Dept Phys, Corvallis, OR 97331 USA

来源：

OPTICS EXPRESS | 2015年 / 23卷 / 03期

基金：

美国国家科学基金会;

关键词：

STRUCTURED-ILLUMINATION MICROSCOPY; PHASE; RECONSTRUCTION;

D O I：

10.1364/OE.23.002753

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present an imaging technique that allows the recovery of the profile of wavelength-scale objects with deep subwavelength resolution based on far-field intensity measurements. The approach, interscale mixing microscopy (IMM), relies on diffractive elements positioned in the near-field proximity of an object in order to scatter information carried by evanescent waves into propagating part of the spectrum. A combination of numerical solutions of Maxwell equations and nonlinear fitting is then used to recover the information about the object based on far-field intensity measurements. It is demonstrated that IMM has the potential to recover wavelength/20 features of wavelength-scale objects in the presence of 10% noise. (C) 2015 Optical Society of America

引用

页码：2753 / 2763

页数：11

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