Chemical Fingerprinting of Polymers Using Electron Energy-Loss Spectroscopy

被引:13
|
作者
Pal, Ruchi [1 ,2 ]
Bourgeois, Laure [3 ,4 ]
Weyland, Matthew [3 ,4 ]
Sikder, Arun K. [5 ]
Saito, Kei [6 ,7 ]
Funston, Alison M. [6 ,8 ]
Bellare, Jayesh R. [9 ]
机构
[1] Indian Inst Technol, IITB Monash Res Acad, Mumbai 400076, Maharashtra, India
[2] IIT Delhi, Dept Mat Sci & Engn, Delhi 110016, India
[3] Monash Univ, Monash Ctr Electron Microscopy, Clayton, Vic 3800, Australia
[4] Monash Univ, Dept Mat Sci & Engn, Clayton, Vic 3800, Australia
[5] SABIC Res & Technol Pvt Ltd, Bengaluru 562125, India
[6] Monash Univ, Sch Chem, Clayton, Vic 3800, Australia
[7] Kyoto Univ, GSAIS, Sakyo Ku, 1 Yoshida Nakaadachi Cho, Kyoto 6068306, Japan
[8] Monash Univ, Sch Chem, ARC Ctr Excellence Exciton Sci, Clayton, Vic 3800, Australia
[9] Indian Inst Technol, Dept Chem Engn, Mumbai 400076, Maharashtra, India
来源
ACS OMEGA | 2021年 / 6卷 / 37期
基金
澳大利亚研究理事会;
关键词
RADIATION-DAMAGE; EELS ANALYSIS; IRRADIATION; POLYSTYRENE; NEXAFS; SPECTRA; XANES; TEM;
D O I
10.1021/acsomega.1c02939
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Electron energy-loss spectroscopy (EELS) is becoming an important tool in the characterization of polymeric materials. The sensitivity of EELS to changes in the chemical structure of polymeric materials dictates its applicability. In particular, it is important for compositional analysis to have reference spectra of pure components. Here, we report the spectra of the carbon K-edge of six polymers (polyethylene, polypropylene, polybutylene terephthalate, and polylactic acid) including copolymers (styrene acrylonitrile and acrylonitrile butadiene styrene), to be used as reference spectra for future EELS studies of polymers. We have successfully decomposed the carbon K-edge of each of the polymers and assigned the observed peaks to bonding transitions. The spectra have been acquired in standard experimental conditions, and electron beam damage has been taken into account during establishment of spectral-structural relationships. We found that the more commonly available low-energy resolution spectrometers are adequate to chemically fingerprint linear saturated hydrocarbons such as PE, PP, and PLA. We have thus moved a step closer toward creating an atlas of polymer EELS spectra, which can be subsequently used for chemical bond mapping of polymeric materials with nanoscale spatial resolution.
引用
收藏
页码:23934 / 23942
页数:9
相关论文
共 50 条
  • [1] Chemical fingerprinting of polyvinyl acetate and polycarbonate using electron energy-loss spectroscopy
    Pal, Ruchi
    Bourgeois, Laure
    Weyland, Matthew
    Sikder, Arun K.
    Saito, Kei
    Funston, Alison M.
    Bellare, Jayesh R.
    POLYMER CHEMISTRY, 2020, 11 (34) : 5484 - 5492
  • [2] ELECTRON ENERGY-LOSS SPECTROSCOPY AND CHEMICAL-CHANGE
    EGERTON, RF
    CROZIER, PA
    RICE, P
    ULTRAMICROSCOPY, 1987, 23 (3-4) : 305 - 312
  • [3] Chemical analysis of polymers using transmission electron microscopy electron energy-loss spectroscopy: The example of poly(ethylene terephthalate)
    Varlot, K
    Martin, JM
    Quet, C
    Kihn, Y
    MACROMOLECULAR SYMPOSIA, 1997, 119 : 317 - 324
  • [4] ELECTRON ENERGY-LOSS SPECTROSCOPY
    WILLIAMS, BG
    PROGRESS IN SOLID STATE CHEMISTRY, 1987, 17 (02) : 87 - 143
  • [5] ELECTRON ENERGY-LOSS SPECTROSCOPY
    JOY, DC
    MAHER, DM
    JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (03): : 260 - 270
  • [6] Electron energy-loss spectroscopy
    Egerton, R
    PHYSICS WORLD, 1997, 10 (04) : 47 - 51
  • [7] QUANTITATIVE CHEMICAL-ANALYSIS OF RHODIZITE, USING ELECTRON ENERGY-LOSS SPECTROSCOPY
    SAUER, H
    ENGEL, W
    BRYDSON, R
    EUROPEAN JOURNAL OF CELL BIOLOGY, 1987, 44 : 50 - 50
  • [8] TRANSMISSION ELECTRON ENERGY-LOSS SPECTROSCOPY
    FINK, J
    TOPICS IN APPLIED PHYSICS, 1992, 69 : 203 - 241
  • [9] Electron energy-loss spectroscopy in the TEM
    Egerton, R. F.
    REPORTS ON PROGRESS IN PHYSICS, 2009, 72 (01)
  • [10] Fundamentals of electron energy-loss spectroscopy
    Hofer, F.
    Schmidt, F. P.
    Grogger, W.
    Kothleitner, G.
    14TH EUROPEAN WORKSHOP ON MODERN DEVELOPMENTS AND APPLICATIONS IN MICROBEAM ANALYSIS (EMAS 2015 WORKSHOP), 2016, 109