High Performance InP-based Quantum Dot Light-Emitting Diodes via the Suppression of Field-Enhanced Electron Delocalization

被引:52
作者
Li, Haiyang [1 ,2 ]
Bian, Yangyang [1 ]
Zhang, Wenjing [1 ]
Wu, Zhenghui [1 ,3 ]
Ahn, Tae Kyu [2 ]
Shen, Huaibin [1 ]
Du, Zuliang [1 ]
机构
[1] Henan Univ, Sch Mat & Engn, Natl & Local Joint Engn Res Ctr High Efficiency D, Key Lab Special Funct Mat,Minist Educ, Kaifeng 475004, Peoples R China
[2] Sungkyunkwan Univ SKKU, Suwon 16419, South Korea
[3] Southern Univ Sci & Technol, Dept Elect & Elect Engn, Shenzhen 518055, Peoples R China
基金
中国国家自然科学基金;
关键词
efficiency roll-offs; electron delocalization; field-enhanced delocalization; InP-based quantum dot light-emitting diodes; trapped excitons; TRAP STATES; NANOCRYSTALS; PHOTOLUMINESCENCE; EFFICIENT; EMISSION; SURFACE; BLUE; DEFECTS; EXCITON; BRIGHT;
D O I
10.1002/adfm.202204529
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
To understand the exciton dynamics due to the electron delocalization in InP-based quantum dot light-emitting diodes (QLEDs), the exciton dynamics are systematically controlled in InP-based QLEDs through varying the shell thicknesses of InP/ZnSe quantum dots (QDs) and the effective electrical field (E-field) across the QDs. It is found that the field-independent energy transfer is effectively suppressed as the shell thickness increases. However, InP/ZnSe QDs with thicker shells only have limited benefit for suppressing the exciton transfer due to field-enhanced electron delocalization in films on electron transport layers or working devices. The field-assisted exciton transfer is mainly driven by the large E-field and field-enhanced electron delocalization in InP/ZnSe QDs. External quantum efficiency of 22.56% is achieved in InP-based QLEDs by reducing the effective E-field (at 2 V bias). The breakthrough luminance of 136 090 cd/m(-2) is achieved at a large bias of 7.2 V, due to the suppression of field-enhanced electron delocalization by the ultra-thick shell.
引用
收藏
页数:9
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