A high resolution X-ray crystal spectrometer to study electron and heavy-ion impact atomic collisions

被引:4
作者
Kumar, Ajay [1 ]
Misra, D. [1 ]
Kelkar, A. H. [1 ]
Kadhane, U. R. [1 ]
Thulasiram, K. V. [1 ]
Tribedi, Lokesh C. [1 ]
机构
[1] Tata Inst Fundamental Res, Bombay 400005, Maharashtra, India
来源
PRAMANA-JOURNAL OF PHYSICS | 2007年 / 68卷 / 06期
关键词
crystal spectrometer; X-rays; highly charged ions; electron impact; ionization;
D O I
10.1007/s12043-007-0097-2
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We have studied fast ion-atom and electron-atom collision processes using a reconditioned high resolution X-ray spectrometer. The X-rays, generated by the collisions, are dispersed by a curved ADP crystal (Johansson geometry) and detected by a gas proportional counter. A self-written LabVIEW based program has been used to give precise and controlled movement to the crystal and for data acquisition. The performance was tested by detecting the K alpha diagram and satellite lines of several elements. The K alpha satellite lines of Al have been studied in collision with 3-12 keV electrons and 40 MeV C4+ ions. In ion collisions as large as four L-vacancies are created simultaneously with the K-vacancy, compared to two satellites in case of the e-impact. In addition, we have measured the X-rays from H-, He-and Li-like Si ions which arise due to the electron loss/capture process in highly charged 80 MeV Si7+ ions in collision with thin carbon foil. Approximate charge state distribution has been obtained using this new technique.
引用
收藏
页码:983 / 994
页数:12
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