Micro-Raman Spectroscopy on Pentacene Thin-Film Transistors

被引：16

作者：

Hosoi, Yoshinobu ^{[1
]}

Deyra, Daniel Martinez ^{[1
]}

Nakajima, Kazuhiro ^{[1
]}

Furukawa, Yukio ^{[1
]}

机构：

[1] Waseda Univ, Sch Adv Sci & Engn, Dept Chem & Biochem, Shinjuku Ku, Tokyo 1698555, Japan

来源：

MOLECULAR CRYSTALS AND LIQUID CRYSTALS | 2008年 / 491卷

关键词：

organic thin-film transistor; pentacene; Raman spectroscopy;

D O I：

10.1080/15421400802331083

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Molecular orientation in pentacene films and thin-film transistors has been studied by micro-Raman spectroscopy. We have found that the relative intensity of the 1596-cm(-1) band (B-3g) is sensitive to the molecular orientation. The standing orientation was observed for the films formed on the bare and hexamethyldisilazane (HMDS)-modified SiO2 surfaces and the Au surfaces modified with self-assembled monolayers (SAMs), whereas the lying orientation for the films on the bare Au surface. We have explicitly demonstrated the differences of the molecular orientation in the films on SiO2 dielectric layers and Au electrodes in the devices by mapping measurements.

引用

页码：317 / 323

页数：7

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