Effects of Au and Pd Additions on Joint Strength, Electrical Resistivity, and Ion-Migration Tolerance in Low-Temperature Sintering Bonding Using Ag2O Paste

被引:14
作者
Ito, Takeyasu [1 ]
Ogura, Tomo [1 ]
Hirose, Akio [1 ]
机构
[1] Osaka Univ, Grad Sch Engn, Dept Mat & Mfg Sci, Suita, Osaka 5650871, Japan
关键词
Silver oxide; reduction; silver nanoparticles; sintering bonding; ion migration; additive metals; METALLOORGANIC NANOPARTICLES; SILVER; METALS;
D O I
10.1007/s11664-012-2167-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A new bonding process using an Ag2O paste consisting of Ag2O particles mixed with a triethylene glycol reducing agent has been proposed as an alternative joining approach for microsoldering in electronics assembly, which currently uses Pb-rich, high-temperature solders. Ag nanoparticles were formed at approximately 130A degrees C to 160A degrees C through a reduction process, sintered to one another immediately, and bonded to a metal substrate. An Au-coated Cu specimen was successfully bonded using the Ag2O paste. The resulting joint exhibited superior strength compared with joints fabricated using conventional Pb-rich solders. To improve ion-migration tolerance, the Ag2O paste was mixed with Au and Pd microparticles to form sintered Ag-Au and Ag-Pd layers, respectively. The additions of Au and Pd improved the ion-migration tolerance of the joint. Regarding the mechanical properties of the joints, addition of secondary Au and Pd both resulted in decreased joint strength. To match the joint strength of conventional Pb-10Sn solder, the mixing ratios of Au and Pd were estimated to be limited to 16 vol.% and 7 vol.%, respectively. The electrical resistivities of the sintered layers consisting of 16 vol.% Au and 7 vol.% Pd were lower than that of Pb-10Sn solder. Thus, the additive fractions of Au and Pd to the Ag2O paste should be less than 16 vol.% and 7 vol.%, respectively, to avoid compromising the mechanical and electrical properties of the sintered layer relative to those of contemporary Pb-10Sn solder. Following the addition of Au and Pd to the paste, the ion-migration tolerances of the sintered layers were approximately 3 and 2 times higher than that of pure Ag, respectively. Thus, the addition of Au was found to improve the ion-migration tolerance of the sintered Ag layer more effectively and with less sacrifice of the mechanical and electrical properties of the sintered layer than the addition of Pd.
引用
收藏
页码:2573 / 2579
页数:7
相关论文
共 18 条
[11]   Transport properties in network models with perfectly conducting channels [J].
Kobayashi, K. ;
Hirose, K. ;
Obuse, H. ;
Ohtsuki, T. ;
Slevin, K. .
25TH INTERNATIONAL CONFERENCE ON LOW TEMPERATURE PHYSICS (LT25), PART 2, 2009, 150
[12]   Low-Temperature Sintering of Nanoscale Silver Paste for Attaching Large-Area (> 100 mm2) Chips [J].
Lei, Thomas Guangyin ;
Calata, Jesus Noel ;
Lu, Guo-Quan ;
Chen, Xu ;
Luo, Shufang .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2010, 33 (01) :98-104
[13]   On the resistance of silver migration in Ag-Pd conductive thick films under humid environment and applied dc field [J].
Lin, JC ;
Chan, JY .
MATERIALS CHEMISTRY AND PHYSICS, 1996, 43 (03) :256-265
[14]   Thermal behavior of silver nanoparticles for low-temperature interconnect applications [J].
Moon, KS ;
Dong, H ;
Maric, R ;
Pothukuchi, S ;
Hunt, A ;
Li, Y ;
Wong, CP .
JOURNAL OF ELECTRONIC MATERIALS, 2005, 34 (02) :168-175
[15]   A Low-Temperature Bonding Process Using Mixed Cu-Ag Nanoparticles [J].
Morisada, Y. ;
Nagaoka, T. ;
Fukusumi, M. ;
Kashiwagi, Y. ;
Yamamoto, M. ;
Nakamoto, M. .
JOURNAL OF ELECTRONIC MATERIALS, 2010, 39 (08) :1283-1288
[16]   Direct Bonding to Aluminum with Silver-Oxide Microparticles [J].
Morita, Toshiaki ;
Yasuda, Yusuke ;
Ide, Eiichi ;
Hirose, Akio .
MATERIALS TRANSACTIONS, 2009, 50 (01) :226-228
[17]   Bonding Technique Using Micro-Scaled Silver-Oxide Particles for In-Situ Formation of Silver Nanoparticles [J].
Morita, Toshiaki ;
Yasuda, Yusuke ;
Ide, Eiichi ;
Akada, Yusuke ;
Hirose, Akio .
MATERIALS TRANSACTIONS, 2008, 49 (12) :2875-2880
[18]  
Takeda N., 2009, P INT C EL PACK, P760