Lee discrepancy on asymmetrical factorials with two- and three-levels

被引：16

作者：

Chatterjee Kashinath ^{[2
]}

Qin Hong ^{[1
]}

Zou Na ^{[1
,3
]}

机构：

[1] Cent China Normal Univ, Fac Math & Stat, Wuhan 430079, Peoples R China

[2] Visva Bharati Univ, Dept Stat, Santini Ketan, W Bengal, India

[3] Zhongnan Univ Econ & Law, Dept Stat, Wuhan 430079, Peoples R China

来源：

SCIENCE CHINA-MATHEMATICS | 2012年 / 55卷 / 03期

基金：

高等学校博士学科点专项科研基金;

关键词：

Lee discrepancy; lower bound; minimum moment aberration; orthogonality; uniformity; DESIGNS; ABERRATION;

D O I：

10.1007/s11425-012-4366-2

中图分类号：

O29 [应用数学];

学科分类号：

070104 ;

摘要：

Lee discrepancy has been employed to measure the uniformity of fractional factorials. In this paper, we further study the statistical justification of Lee discrepancy on asymmetrical factorials. We will give an expression of the Lee discrepancy of asymmetrical factorials with two- and three-levels in terms of quadric form, present a connection between Lee discrepancy, orthogonality and minimum moment aberration, and obtain a lower bound of Lee discrepancy of asymmetrical factorials with two- and three-levels.

引用

页码：663 / 670

页数：8

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