A physics based analytical solution to undoped cylindrical surrounding-gate (SRG) MOSFETs

被引:0
|
作者
He, J [1 ]
Chan, MS [1 ]
机构
[1] Univ Calif Berkeley, Dept EECS, Berkeley, CA 94720 USA
来源
ICCDCS 2004: Fifth International Caracas Conference on Devices, Circuits and Systems | 2004年
关键词
MOSFETs; non-classical CMOS; cylindrical; surrounding-gate; device physics; and compact modeling;
D O I
暂无
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A physics based analytical solution to undoped cylindrical Surrounding-Gate (SRG) MOSFETs is derived in this paper by solving the Poisson-Boltzmann equation. The solution produces a closed form solution for the energy band bending. Based on the solution, the exact inversion charge density can be directly expressed as a function of the quasi-Fermi potential, gate voltage and device structure geometries. The accurate Physics included in the analytical solution can be used to predict the performance of surrounding-gate MOSFETs under unconventional operation conditions such as volume inversion effect due to silicon body diameter and structure dependent effective oxide thickness effects that are unique in a SRG MOSFET.
引用
收藏
页码:26 / 28
页数:3
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