Nanoscale quantification of octahedral tilts in perovskite films

被引：53

作者：

Hwang, Jinwoo ^{[1
]}

Zhang, Jack Y. ^{[1
]}

Son, Junwoo ^{[1
]}

Stemmer, Susanne ^{[1
]}

机构：

[1] Univ Calif Santa Barbara, Dept Mat, Santa Barbara, CA 93106 USA

来源：

APPLIED PHYSICS LETTERS | 2012年 / 100卷 / 19期

基金：

美国国家科学基金会;

关键词：

RNIO3; R; TRANSITIONS;

D O I：

10.1063/1.4714734

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

NiO6-octahedral tilts in ultrathin LaNiO3 films were studied using position averaged convergent beam electron diffraction (PACBED) in scanning transmission electron microscopy. Both the type and magnitude of the octahedral tilts were determined by comparing PACBED experiments to frozen phonon multislice simulations. It is shown that the out-of-plane octahedral tilt of an epitaxial film under biaxial tensile stress (0.78% in-plane tensile strain) increases by similar to 20%, while the in-plane rotation decreases by similar to 80%, compared to the unstrained bulk material. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4714734]

引用

页数：3

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