Experimental and Theoretical Study of the Optical and Electrical Properties of Nanostructured Indium Tin Oxide Fabricated by Oblique-Angle Deposition

被引:20
|
作者
Sood, Adam W. [1 ,2 ,3 ,4 ]
Poxson, David J. [1 ,2 ]
Mont, Frank W. [1 ,2 ]
Chhajed, Sameer [1 ,2 ]
Cho, Jaehee [1 ,2 ]
Schubert, E. Fred [1 ,2 ]
Welser, Roger E. [3 ,4 ]
Dhar, Nibir K. [5 ]
Sood, Ashok K. [3 ,4 ]
机构
[1] Rensselaer Polytech Inst, Dept Elect Comp & Syst Engn, Troy, NY 12180 USA
[2] Rensselaer Polytech Inst, Rensselaer Nanotechnol Ctr, Troy, NY 12180 USA
[3] Magnolia Opt Technol Inc, Woburn, MA 01801 USA
[4] Magnolia Solar Inc, Woburn, MA 01801 USA
[5] DARPA, MTO, Arlington, VA 22203 USA
基金
美国国家科学基金会;
关键词
Oblique-Angle Deposition; Indium Tin Oxide; Optical Coating; PERFECT ANTIREFLECTION COATINGS; THIN-FILMS; INDEX; REFLECTION;
D O I
10.1166/jnn.2012.6181
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Oblique-angle deposition of indium tin oxide (ITO) is used to fabricate optical thin-film coatings with a porous, columnar nanostructure. Indium tin oxide is a material that is widely used in industrial applications because it is both optically transparent and electrically conductive. The ITO coatings are fabricated, using electron-beam evaporation, with a range of deposition angles between 0 degrees (normal incidence) and 80 degrees. As the deposition angle increases, we find that the porosity of the ITO film increases and the refractive index decreases. We measure the resistivity of the ITO film at each deposition angle, and find that as the porosity increases, the resistivity increases superlinearly. A new theoretical model is presented to describe the relationship between the ITO film's resistivity and its porosity. The model takes into account the columnar structure of the film, and agrees very well with the experimental data.
引用
收藏
页码:3950 / 3953
页数:4
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