Spectral domain fluorescence coherence phase microscopy

被引:2
|
作者
Quintin, Andra St. [1 ]
Merhi, Lukas-Karim [1 ]
Sarunic, Marinko V. [1 ]
机构
[1] Simon Fraser Univ, Sch Engn Sci, Burnaby, BC V5A 1S6, Canada
关键词
INTERFERENCE-CONTRAST MICROSCOPY; OXIDIZED SILICON; LOCALIZATION; TOMOGRAPHY;
D O I
10.1364/AO.50.001798
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Spectral domain phase microscopy (SDPM) has been reported in the literature as a functional extension to low-coherence interferometry, which enables nanoscale measurement of a scatter's displacement. The signal in SDPM is generated from structural images that lack molecular specificity. This paper investigates the expansion of phase analysis to fluorescence self-interference signals to provide functional information about a sample. Spectral domain fluorescence coherence phase microscopy is demonstrated for nanoscale resolution motion detection of fluorescent particles with a signal-to-noise ratio limited resolution of similar to 10nm. This paper demonstrates the feasibility of combining phase processing with fluorescence self-interference, which may be useful for future applications such as cell rheology. (C) 2011 Optical Society of America
引用
收藏
页码:1798 / 1804
页数:7
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