Beam characterization for the field-emitter-array cathode-based low-emittance gun

被引：32

作者：

Leemann, S. C. ^{[1
]}

Streun, A. ^{[1
]}

Wrulich, A. F. ^{[1
]}

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

来源：

PHYSICAL REVIEW SPECIAL TOPICS-ACCELERATORS AND BEAMS | 2007年 / 10卷 / 07期

关键词：

EMISSION;

D O I：

10.1103/PhysRevSTAB.10.071302

中图分类号：

O57 [原子核物理学、高能物理学];

学科分类号：

070202 ;

摘要：

A 1 angstrom x- ray free electron laser can be operated at 6 GeV provided a very high brightness electron beam. Therefore, Paul Scherrer Institute has initiated development of the low-emittance gun based on field emission. A field-emitter array (FEA) is expected to deliver high peak current while reducing the source emittance to levels close to the thermal limit. A 100 keV gun test stand has been designed in order to gain experience with electron bunches emitted by pulsed FEAs, investigate emittance compensation, and develop diagnostic procedures to characterize the beam. First FEA samples have been installed and pulsed in the gun; the emitted bunches have been accelerated and characterized. We present results acquired with the first FEA samples.

引用

页数：6

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