Approach to Fault Identification for Electronic Products Using Mahalanobis Distance

被引:79
作者
Kumar, Sachin [1 ]
Chow, Tommy W. S. [2 ]
Pecht, Michael [1 ]
机构
[1] Univ Maryland, CALCE, Prognost & Hlth Management Lab, College Pk, MD 20742 USA
[2] City Univ Hong Kong, Dept Elect Engn, Prognost & Hlth Management Ctr, Kowloon, Hong Kong, Peoples R China
关键词
Computers; diagnostics; electronic products; fault identification; fault isolation; Mahalanobis distance (MD); OF-THE-ART; HEALTH MANAGEMENT;
D O I
10.1109/TIM.2009.2032884
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents a Mahalanobis distance (MD) based diagnostic approach that employs a probabilistic approach to establish thresholds to classify a product as being healthy or unhealthy. A technique for detecting trends and biasness in system health is presented by constructing a control chart for the MD value. The performance parameters' residuals, which are the differences between the estimated values (from an empirical model) and the observed values (from health monitoring), are used to isolate parameters that exhibit faults. To aid in the qualification of a product against a specific known fault, we suggest that a fault-specific threshold MD value be defined by minimizing an error function. A case study on notebook computers is presented to demonstrate the applicability of this proposed diagnostic approach.
引用
收藏
页码:2055 / 2064
页数:10
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