Effects of film thickness and mismatch strains on magnetoelectric coupling in vertical heteroepitaxial nanocomposite thin films

被引：16

作者：

Chen, H. T. ^{[1
]}

Hong, L. ^{[1
]}

Soh, A. K. ^{[1
]}

机构：

[1] Univ Hong Kong, Dept Mech Engn, Hong Kong, Hong Kong, Peoples R China

来源：

JOURNAL OF APPLIED PHYSICS | 2011年 / 109卷 / 09期

关键词：

D O I：

10.1063/1.3583599

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The phase field model is adopted to study the magnetoelectric coupling effects in vertical heteroepitaxial nanocomposite thin films. Both the lateral epitaxial strains between the film and the substrate and the vertical epitaxial strains between the ferroelectric and ferromagnetic phases are accounted for in the model devised. The effects of the film thickness on the magnetic-field-induced electric polarization (MIEP) are investigated. The results obtained show that the MIEP is strongly dependent on the film thickness, as well as on the vertical and lateral epitaxial strains. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3583599]

引用

页数：5

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