Iodine solid source inductively coupled plasma etching of InP

被引:9
作者
Matsutani, A
Ohtsuki, H
Koyama, F
机构
[1] Tokyo Inst Technol, Precis & Intelligence Lab, Midori Ku, Yokohama, Kanagawa 2268503, Japan
[2] Samco Int Inc, Fujimi Ku, Kyoto 6128443, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 2005年 / 44卷 / 16-19期
关键词
iodine; InP; inductively coupled plasma (ICP); dry etching; solid source;
D O I
10.1143/JJAP.44.L576
中图分类号
O59 [应用物理学];
学科分类号
摘要
We have demonstrated vertical and smooth inductively coupled plasma (ICP) dry etching of InP using solid iodine as a gas source at a low process temperature of 90 degrees C. We prepared a solid iodine crystal in the ICP etching chamber as the etching gas source. Iodine gas was supplied from the solid source at a high vapor pressure into the process chamber. Vertical and smooth etching was realized under the condition of low temperature and low power. The typical etching rate was 0.4 mu m/min. We believe that solid I-2-ICP etching is a very simple and useful process for InP-based device fabrication with a resist mask.
引用
收藏
页码:L576 / L577
页数:2
相关论文
共 4 条
  • [1] Low-temperature dry etching of InP by inductively coupled plasma using HI/Cl2
    Matsutani, A
    Ohtsuki, H
    Koyama, F
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2003, 42 (12A): : L1414 - L1415
  • [2] REACTIVE-ION-BEAM ETCHING OF INP IN A CHLORINE-HYDROGEN MIXTURE
    VAWTER, GA
    ASHBY, CIH
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (06): : 3374 - 3377
  • [3] CHLORINE-BASED SMOOTH REACTIVE ION-BEAM ETCHING OF INDIUM-CONTAINING III-V COMPOUND SEMICONDUCTOR
    YOSHIKAWA, T
    KOHMOTO, S
    ANAN, M
    HAMAO, N
    BABA, M
    TAKADO, N
    SUGIMOTO, Y
    SUGIMOTO, M
    ASAKAWA, K
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (12B): : 4381 - 4386
  • [4] CHARACTERIZATION OF CHEMICALLY ASSISTED ION-BEAM ETCHING OF INP
    YOUTSEY, C
    GRUNDBACHER, R
    PANEPUCCI, R
    ADESIDA, I
    CANEAU, C
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (06): : 3317 - 3321