Compensation of charging in X-PEEM: a successful test on mineral inclusions in 4.4 Ga old zircon

被引：55

作者：

De Stasio, G

Frazer, BH

Gilbert, B

Richter, KL

Valley, JW

机构：

[1] Univ Wisconsin, Dept Phys, Stoughton, WI 53589 USA

[2] Univ Wisconsin, Ctr Synchrotron Radiat, Stoughton, WI 53589 USA

[3] Ecole Polytech Fed Lausanne, Inst Phys Appl, CH-1015 Lausanne, Switzerland

[4] Univ Calif Berkeley, Berkeley, CA 94720 USA

[5] Bob Jones Univ, Greenville, SC 29614 USA

[6] Univ Wisconsin, Dept Geol & Geophys, Madison, WI 53706 USA

来源：

ULTRAMICROSCOPY | 2003年 / 98卷 / 01期

基金：

美国国家科学基金会;

关键词：

instrumentation and techniques for geophysical analysis; X-ray absorption spectra; X-ray microscopy; microscopic defects (voids; inclusions; etc.);

D O I：

10.1016/S0304-3991(03)00088-3

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We present a new differential-thickness coating technique to analyze insulating samples with X-ray PhotoElectron Emission spectroMicroscopy (X-PEEM). X-PEEM is non-destructive, analyzes the chemical composition and crystal structure of minerals and can spatially resolve chemical species with a resolution presently reaching 35 nm. We tested the differential coating by analyzing a 4.4 billion-year-old zircon (ZrSiO4) containing silicate inclusions. We observed quartz (SiO2) inclusions smaller than 1 mum in size that can only be analyzed non-destructively with synchrotron spectromicroscopies. With the removal of charging we greatly extend the range of samples that can be analyzed by X-PEEM. (C) 2003 Elsevier Science B.V. All rights reserved.

引用

页码：57 / 62

页数：6

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