Nanoindentation:: a suitable tool to determine local mechanical properties in microelectronic packages and materials?

被引:30
作者
Albrecht, HJ
Hannach, T
Häse, A
Juritza, A
Müller, K
Müller, WH
机构
[1] Tech Univ Berlin, Inst Mech, D-10587 Berlin, Germany
[2] Siemens AG, D-13623 Berlin, Germany
[3] Neue Mat Bayreuth GmbH, D-95448 Bayreuth, Germany
关键词
D O I
10.1007/s00419-005-0394-5
中图分类号
O3 [力学];
学科分类号
08 ; 0801 ;
摘要
In what follows we determine the mechanical properties of intermetallic phases in microelectronic structures with the help of nanoindentation. Additionally, we try to answer the question of whether nanoindentation can be used to quantify the growth of intermetallic phases, in particular at the interface of a solder connection. Different specimens and treatments (such as reflow processes and subsequent aging) have been analyzed and their influence on mechanical properties will be examined. Finite element (FE) simulations, which are also discussed, will use the results of these experiments as reference values.
引用
收藏
页码:728 / 738
页数:11
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