Low Energy Electron Point Source Microscopy of Two-Dimensional Carbon Nanostructures

被引：8

作者：

Vieker, Henning ^{[1
]}

Beyer, Andre ^{[1
]}

Blank, Holger ^{[2
]}

Weber, Dirk Henning ^{[1
]}

Gerthsen, Dagmar ^{[2
]}

Goelzhaeuser, Armin ^{[1
]}

机构：

[1] Univ Bielefeld, D-33615 Bielefeld, Germany

[2] Karlsruhe Inst Technol, Lab Electron Microscopy, D-76131 Karlsruhe, Germany

来源：

ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-INTERNATIONAL JOURNAL OF RESEARCH IN PHYSICAL CHEMISTRY & CHEMICAL PHYSICS | 2011年 / 225卷 / 11-12期

关键词：

Carbon Nanomembrane (CNM); Graphene; Low Energy Electron Point Source Microscopy (LEEPS); Transmission Electron Microscopy (TEM); SELF-ASSEMBLED MONOLAYERS; NANOSHEETS; CONDUCTIVITY; FABRICATION; HOLOGRAPHY;

D O I：

10.1524/zpch.2011.0191

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

I nm thick carbon nanomembranes (CNMs) are investigated with Low Energy Electron Point Source (LEEPS) microscopy. A CNM consists of a freely suspended carbon film made from a cross-linked self-assembled monolayer (SAM). During thermal annealing the CNM transforms into nanocrystalline graphene. We determined the electron transmissivity of CNMs from the LEEPS images. After pyrolysis, the LEEPS images showed clear differences compared to pristine CNMs. Upon annealing above 800 degrees C the LEEPS images exhibit distinct features that are related to the structural transition. A comparison of LEEPS images with transmission electron micrographs of the same regions and features demonstrates that both microscopic techniques reveal similar structural features.

引用

页码：1433 / 1445

页数：13

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