COMPARISONS OF ENVELOPE MORPHOLOGICAL FILTERING METHODS AND VARIOUS REGULAR ALGORITHMS FOR SURFACE TEXTURE ANALYSIS

被引:25
作者
Podulka, Przemyslaw [1 ]
机构
[1] Rzeszow Univ Technol, Fac Mech Engn & Aeronaut, Al Powstancow Warszawy 12, PL-35959 Rzeszow, Poland
关键词
surface texture; surface topography measurement; envelope filter; morphological filtering; measurement errors; STYLUS METHODS; OPERATIONS; METROLOGY;
D O I
10.24425/mms.2020.132772
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In this paper both envelope approach and morphological filters for characterisation of surface textures were proposed, applied and thoroughly examined. Obtained results were compared with those received after appliance of commonly-used algorithms. The effect of appliance of proposed procedures on surface topography parameters (from ISO 25178 standard) was taken into consideration. The following types of surface textureswere assessed: two-process plateau-honed cylinder liners, plateau-honed cylinder liners with additionally burnished dimples, turned piston skirts, grinded and/or isotropic topographies. It was assumed that envelope characteristics (envelope filtration) can provide results useful for assessments of deep and/or wide oil-reservoirs especially when they are edge located. Moreover, some near-valley areas of surface texture details can be less distorted when envelope filtering is accomplished. It was also found that closing and/or opening envelope filtration can be valuable for reduction of some surface topography measurement errors.
引用
收藏
页码:243 / 263
页数:21
相关论文
共 35 条
  • [1] Coherent noise suppression in digital holography based on flat fielding with apodized apertures
    Abdelsalam, D. G.
    Kim, Daesuk
    [J]. OPTICS EXPRESS, 2011, 19 (19): : 17951 - 17959
  • [2] Brinkmann S., 2003, ADV TECHNIQUES ASSES, P62
  • [3] Principles of interference microscopy for the measurement of surface topography
    de Groot, Peter
    [J]. ADVANCES IN OPTICS AND PHOTONICS, 2015, 7 (01): : 1 - 65
  • [4] A review of selected topics in interferometric optical metrology
    de Groot, Peter J.
    [J]. REPORTS ON PROGRESS IN PHYSICS, 2019, 82 (05)
  • [5] The Meaning and Measure of Vertical Resolution in Optical Surface Topography Measurement
    de Groot, Peter J.
    [J]. APPLIED SCIENCES-BASEL, 2017, 7 (01):
  • [6] Back to the envelope system with morphological operations for the evaluation of surfaces
    Dietzsch, Michael
    Gerlach, Marco
    Groeger, Sophie
    [J]. WEAR, 2008, 264 (5-6) : 411 - 415
  • [7] Calibration of the scales of areal surface topography-measuring instruments: part 1. Measurement noise and residual flatness
    Giusca, Claudiu L.
    Leach, Richard K.
    Helary, Franck
    Gutauskas, Tadas
    Nimishakavi, Lakshmi
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2012, 23 (03)
  • [8] Feature based characterization of worn surfaces for a sliding test
    Hao, Q.
    Bianchi, D.
    Kaestner, M.
    Reithmeier, E.
    [J]. TRIBOLOGY INTERNATIONAL, 2010, 43 (5-6) : 1186 - 1192
  • [9] ISO, ISO 25178-3:2012
  • [10] Gaussian filters with profile extrapolation
    Janecki, Dariusz
    [J]. PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2011, 35 (04): : 602 - 606