Critical Review of Size Effects on Microstructure and Mechanical Properties of Solder Joints for Electronic Packaging

被引:47
作者
Wang, Shaobin [1 ]
Yao, Yao [1 ]
Long, Xu [1 ]
机构
[1] Northwestern Polytech Univ, Sch Mech Civil Engn & Architecture, Xian 710072, Shaanxi, Peoples R China
来源
APPLIED SCIENCES-BASEL | 2019年 / 9卷 / 02期
基金
中国国家自然科学基金;
关键词
size effect; microstructure; mechanical property; solder joint; INTERMETALLIC COMPOUND FORMATION; LEAD-FREE SOLDERS; SN-AG ALLOYS; INTERFACIAL REACTION; CU-SOLDER; FRACTURE-BEHAVIOR; IMC GROWTH; SOLIDIFICATION; METALLIZATION; TEMPERATURE;
D O I
10.3390/app9020227
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
With the miniaturization of electronic packaging and devices, the size of solder joints in electronics is also decreasing from bulk solder joints to micro-bumps. Both the microstructure and mechanical properties of the solder joints are also evolving with the decreasing size, which brings great concern for the reliability of different sizes of solder interconnections. In this paper, the effect of solder size on the microstructure (i.e., interfacial intermetallic compound (IMC) growth, precipitation in the solder matrix, dendrite arms, and undercooling) and mechanical properties (i.e., tensile property, shear and compression strength, fracture toughness, and creep deformation) are reviewed from the mechanical point of view. In addition, some areas for further researches about size effects on solder joints are discussed.
引用
收藏
页数:15
相关论文
共 61 条
[1]   Effect of Joint Size on Microstructure and Growth Kinetics of Intermetallic Compounds in Solid-Liquid Interdiffusion Sn3.5Ag/Cu-Substrate Solder Joints [J].
Abdelhadi, Ousama M. ;
Ladani, Leila .
JOURNAL OF ELECTRONIC PACKAGING, 2013, 135 (02)
[2]   Lead-free solders in microelectronics [J].
Abtew, M ;
Selvaduray, G .
MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2000, 27 (5-6) :95-141
[3]   Overview no. 130 - Size effects in materials due to microstructural and dimensional constraints: A comparative review [J].
Arzt, E .
ACTA MATERIALIA, 1998, 46 (16) :5611-5626
[4]  
Chang CC, 2007, 2007 INTERNATIONAL MICROSYSTEMS, PACKAGING, ASSEMBLY AND CIRCUITS TECHNOLOGY CONFERENCE, PROCEEDINGS OF TECHNICAL PAPERS, P54
[5]   Gap Size Effects on the Shear Strength of Sn/Cu and Sn/FeNi Solder Joints [J].
Chen, Cai ;
Zhang, Lei ;
Zhao, Jiaxi ;
Cao, Lihua ;
Shang, J. K. .
JOURNAL OF ELECTRONIC MATERIALS, 2012, 41 (09) :2487-2494
[6]   Thermal aging effects on microstructures and mechanical properties of an environmentally friendly eutectic tin-copper solder alloy [J].
Gain, Asit Kumar ;
Zhang, Liangchi ;
Quadir, M. Z. .
MATERIALS & DESIGN, 2016, 110 :275-283
[7]   Microstructure, thermal analysis and damping properties of Ag and Ni nano-particles doped Sn-8Zn-3Bi solder on OSP-Cu substrate [J].
Gain, Asit Kumar ;
Zhang, Liangchi .
JOURNAL OF ALLOYS AND COMPOUNDS, 2014, 617 :779-786
[8]   The unusual size effect of eutectic Sn/Pb alloys in the micro regime: Experiments and modeling [J].
Gan, K. F. ;
Ngan, A. H. W. .
ACTA MATERIALIA, 2018, 151 :282-292
[9]   Interfacial fracture toughness of Pb-free solders [J].
Hayes, S. M. ;
Chawla, N. ;
Frear, D. R. .
MICROELECTRONICS RELIABILITY, 2009, 49 (03) :269-287
[10]   Intermetallic compound formation between Sn-3.5Ag solder and Ni-based metallization during liquid state reaction [J].
He, M ;
Lau, WH ;
Qi, GJ ;
Chen, Z .
THIN SOLID FILMS, 2004, 462 :376-383