A hybrid distributed test generation method using deterministic and genetic algorithms

被引：3

作者：

Harmanani, H ^{[1
]}

Karablieh, B ^{[1
]}

机构：

[1] Lebanese Amer Univ, Dept Comp Sci & Math, Byblos 14012010, Lebanon

来源：

FIFTH INTERNATIONAL WORKSHOP ON SYSTEM-ON-CHIP FOR REAL-TIME APPLICATIONS, PROCEEDINGS | 2005年

关键词：

D O I：

10.1109/IWSOC.2005.13

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Test generation is a highly complex and time-consuming task. In this work, we present a distributed method for combinational test generation. The method is based on a hybrid approach that combines both deterministic and genetic approaches. The deterministic phase is based on the D-algorithm and generates an initial set of test vectors that are evolved in the genetic phase in order to achieve a high fault coverage in a short time. The algorithm is parallelized based on a cluster of workstations using the Message Passing Interface (MPI) library. Several benchmark circuits were attempted, and favorable results comparisons are reported.

引用

页码：317 / 322

页数：6

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