Development of a new state-of-the-art beamline optimized for monochromatic single-crystal and powder X-ray diffraction under extreme conditions at the ESRF

被引：134

作者：

Mezouar, M ^{[1
]}

Crichton, WA ^{[1
]}

Bauchau, S ^{[1
]}

Thurel, F ^{[1
]}

Witsch, H ^{[1
]}

Torrecillas, F ^{[1
]}

Blattmann, G ^{[1
]}

Marion, P ^{[1
]}

Dabin, Y ^{[1
]}

Chavanne, J ^{[1
]}

Hignette, O ^{[1
]}

Morawe, C ^{[1
]}

Borel, C ^{[1
]}

机构：

[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2005年 / 12卷

关键词：

synchrotron beamline; X-ray diffraction; high pressure;

D O I：

10.1107/S0909049505023216

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new state-of-the art synchrotron beamline fully optimized for monochromatic X-ray diffraction at high pressure and high ( or low) temperature is presented. In comparison with the old high-pressure beamline ID30, this new beamline exhibits outstanding performance in terms of photon flux and focusing capabilities. The main components of this new instrument will be described in detail and compared with the performance of beamline ID30. In particular, the choices in terms of X-ray source, X-ray optics, sample environment and detectors are discussed. The first results of the beamline commissioning are presented.

引用

页码：659 / 664

页数：6

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