Measurement of depletion region width in poled silica

被引：3

作者：

Franco, CS ^{[1
]}

Quintero, GA

Myrén, N

Kudlinski, A

Zeghlache, H

Carvalho, HR

Triques, ALC

González, DM

Gouvêa, PMP

Martinelli, G

Quiquempois, Y

Lesche, B

Margulis, W

Carvalho, ICS

机构：

[1] Pontificia Univ Catolica Rio de Janeiro, BR-22453900 Rio De Janeiro, Brazil

[2] KTH, Albanova, S-10691 Stockholm, Sweden

[3] Univ Sci & Technol Lille, F-59655 Villeneuve Dascq, France

[4] Univ Fed Juiz De Fora, Dept Fis, BR-36036330 Juiz De Fora, Brazil

[5] Acreo AB, S-16440 Stockholm, Sweden

来源：

APPLIED OPTICS | 2005年 / 44卷 / 27期

关键词：

D O I：

10.1364/AO.44.005793

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

The width of the depletion region in fused-silica samples thermally poled during various periods of time is investigated experimentally with four previously reported characterization techniques in an attempt to unify their findings. Although all measurements give a similar width of the depletion region, it is shown that the determination of the profile of chi((2)) is also required for a good estimate of the nonlinearity induced by poling. (c) 2005 Optical Society of America.

引用

页码：5793 / 5796

页数：4

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