A Simple Linear Technique for Measuring the Carrier-Envelope Offset Phase of Ultrashort Pulses

被引：0
作者：
Jojart, P. [1 ,2 ]
Boerzsoenyi, A. [1 ,2 ]
Koke, S. [3 ]
Goerbe, M. [2 ,4 ]
Osvay, K. [1 ]
机构：
[1] Univ Szeged, Dept Opt & Quantum Elect, POB 406, H-6701 Szeged, Hungary
[2] CE Opt Kft, H-6720 Szeged, Hungary
[3] Max Born Inst Nichtlineare Opt, D-12489 Berlin, Germany
[4] Kecskemet Coll, Fac Mech Engn & Automat, H-6001 Kecskemet, Hungary
来源：
2011 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | 2011年
关键词：
GENERATION;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A spectrally resolved multiple beam interferometer is capable for measuring the carrier-envelope offset phase of ultrashort laser pulses with an accuracy of 70mrad. The performance has been cross-calibrated with a conventional f-to-2f interferometer.
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页数：2
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