Universal Scherrer equation for graphene fragments

被引:182
作者
Lim, Daniel J. [1 ]
Marks, Nigel A. [1 ]
Rowles, Matthew R. [2 ]
机构
[1] Curtin Univ, Dept Phys & Astron, Perth, WA 6102, Australia
[2] Curtin Univ, John Laeter Ctr, Perth, WA 6102, Australia
关键词
X-RAY-DIFFRACTION; CARBON; SCATTERING;
D O I
10.1016/j.carbon.2020.02.064
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Graphene fragments spanning a wide range of size and shape were studied computationally using the Debye scattering equation. The calculated diffraction patterns were analysed using the Scherrer equation to infer the fragment size, L-a. Comparison with the known fragment sizes reveals a strong affine relationship between L-a and the Scherrer quantity lambda/(Bcos theta). To preserve this relationship, we propose modifying the Scherrer equation to include an empirical additive constant. Our approach solves the well-known problem of size-dependence in the shape factor and yields a universal expression by defining L-a as the square-root of the fragment area. The relationship between observed diffraction peak positions and unit cell parameters is also discussed. (C) 2020 Elsevier Ltd. All rights reserved.
引用
收藏
页码:475 / 480
页数:6
相关论文
共 17 条
[1]   An X-ray study of carbon black [J].
Biscoe, J ;
Warren, BE .
JOURNAL OF APPLIED PHYSICS, 1942, 13 (06) :364-371
[2]  
Bragg W.L., 1933, A general survey, the crystalline state, V1, P189
[3]   General equation for the determination of the crystallite size La of nanographite by Raman spectroscopy [J].
Cançado, LG ;
Takai, K ;
Enoki, T ;
Endo, M ;
Kim, YA ;
Mizusaki, H ;
Jorio, A ;
Coelho, LN ;
Magalhaes-Paniago, R ;
Pimenta, MA .
APPLIED PHYSICS LETTERS, 2006, 88 (16)
[4]   A FUNDAMENTAL PARAMETERS APPROACH TO X-RAY LINE-PROFILE FITTING [J].
CHEARY, RW ;
COELHO, A .
JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1992, 25 (pt 2) :109-121
[5]  
Debye P, 1915, ANN PHYS-BERLIN, V46, P809
[6]   X-RAY DIFFRACTION DATA FOR LARGE AROMATIC MOLECULES [J].
DIAMOND, R .
ACTA CRYSTALLOGRAPHICA, 1957, 10 (05) :359-364
[7]   Simulations of X-Ray Scattering on Two-Dimensional, Graphitic and Turbostratic Carbon Structures [J].
Dopita, Milan ;
Rudolph, Martin ;
Salomon, Anton ;
Emmel, Marcus ;
Aneziris, Christos G. ;
Rafaja, David .
ADVANCED ENGINEERING MATERIALS, 2013, 15 (12) :1280-1291
[8]   Theoretical X-ray scattering intensity of carbons with turbostratic stacking and AB stacking structures [J].
Fujimoto, H .
CARBON, 2003, 41 (08) :1585-1592
[9]   Specification for a standard procedure of X-ray diffraction measurements on carbon materials [J].
Iwashita, N ;
Park, CR ;
Fujimoto, H ;
Shiraishi, M ;
Inagaki, M .
CARBON, 2004, 42 (04) :701-714
[10]   New insight on carbonisation and graphitisation mechanisms as obtained from a bottom-up analytical approach of X-ray diffraction patterns [J].
Puech, Pascal ;
Dabrowska, Agnieszka ;
Ratel-Ramond, Nicolas ;
Vignoles, Gerard L. ;
Monthioux, Marc .
CARBON, 2019, 147 :602-611