Data-collection system for high-throughput X-ray absorption fine structure measurements

A new X-ray absorption fine structure (XAFS) data-collection system based on the Experimental Physics and Industrial Control System software environment has been established at the BL14W1 beamline of the Shanghai Synchrotron Radiation Facility. The system provides for automatic sequential analysis of multiple samples for continuous high-throughput (HT) measurements. Specifically, 8 sample pellets are loaded into an alumina holder, and a high-precision two-dimensional translation stage is programmed to switch these samples automatically for collecting the XAFS spectrum of each sample in sequence. Experimenters implement HT measurements via a graphical user interface developed with Control System Studio. Finally, the successful operation of the HT XAFS system is demonstrated by running experiments on two groups of copper-ceria catalysts, each of which contains 8 different powder samples.