Theory of Thermally Induced Phase Noise in Spin Torque Oscillators for a High-Symmetry Case

被引:61
作者
Silva, T. J. [1 ]
Keller, Mark W. [1 ]
机构
[1] Natl Inst Stand & Technol, Boulder, CO 80305 USA
关键词
Langevin equations; macrospin; spin torque; spin torque oscillator; Ornstein-Uhlenbeck; Wiener-Levy; phase noise; MAGNETIC MULTILAYERS; POLARIZED CURRENT; FIELD-DEPENDENCE; BROWNIAN-MOTION; WHITE-NOISE; DRIVEN; FLUCTUATIONS; EXCITATION; EQUATIONS; DEVICES;
D O I
10.1109/TMAG.2010.2044583
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We derive equations for the phase noise spectrum of a spin torque oscillator in the macrospin approximation for the highly symmetric geometry where the equilibrium magnetization, applied field, anisotropy, and spin accumulation are all collinear. This particular problem is one that can be solved by analytical methods, but nevertheless illustrates several important general principles for phase noise in spin torque oscillators. In the limit, where the restoring torque is linearly proportional to the deviation of the precession amplitude from steady-state, the problem reduces to a sum of the Wiener-Levy (W-L) and Ornstein-Uhlenbeck (O-U) processes familiar from the physics of random walks and Brownian motion. For typical device parameters, the O-U process dominates the phase noise and results in a phase noise spectrum that is nontrivial, with 1/omega(2) dependence at low Fourier frequencies, and 1/omega(4) dependence at high Fourier frequencies. The contribution to oscillator linewidth due to the O-U process in the low temperature limit is independent of magnetic anisotropy field H-k and scales inversely with the damping parameter, whereas in the high temperature limit the oscillator linewidth is independent of the damping parameter and scales as root vertical bar H-k vertical bar Numerical integration of the fully nonlinear stochastic differential equations is used to determine the temperature and precession amplitude ranges over which our equations for phase noise and linewidth are valid. We then expand the theory to include effects of spin torque asymmetry. Given the lack of experimental data for nanopillars in the geometry considered here, we make a rough extrapolation to the case of nanocontacts, with reasonable agreement with published data. The theory does not yield any obvious means to reduce phase noise to levels required for practical applications in the geometry considered here.
引用
收藏
页码:3555 / 3573
页数:19
相关论文
共 69 条
[11]   Spin-torque ferromagnetic resonance measurements of damping in nanomagnets [J].
Fuchs, G. D. ;
Sankey, J. C. ;
Pribiag, V. S. ;
Qian, L. ;
Braganca, P. M. ;
Garcia, A. G. F. ;
Ryan, E. M. ;
Li, Zhi-Pan ;
Ozatay, O. ;
Ralph, D. C. ;
Buhrman, R. A. .
APPLIED PHYSICS LETTERS, 2007, 91 (06)
[12]   Thermal fluctuations and longitudinal relaxation of single-domain magnetic particles at elevated temperatures [J].
Garanin, DA ;
Chubykalo-Fesenko, O .
PHYSICAL REVIEW B, 2004, 70 (21) :1-4
[13]   Fokker-Planck and Landau-Lifshitz-Bloch equations for classical ferromagnets [J].
Garanin, DA .
PHYSICAL REVIEW B, 1997, 55 (05) :3050-3057
[14]  
Gardiner C., 2004, QUANTUM NOISE A HDB
[15]   Origin of the spectral linewidth in nonlinear spin-transfer oscillators based on MgO tunnel junctions [J].
Georges, B. ;
Grollier, J. ;
Cros, V. ;
Fert, A. ;
Fukushima, A. ;
Kubota, H. ;
Yakushijin, K. ;
Yuasa, S. ;
Ando, K. .
PHYSICAL REVIEW B, 2009, 80 (06)
[16]   The mathematics of Brownian motion and Johnson noise [J].
Gillespie, DT .
AMERICAN JOURNAL OF PHYSICS, 1996, 64 (03) :225-240
[17]   Phase noise in multi-gigahertz CMOS ring oscillators [J].
Hajimiri, A ;
Limotyrakis, S ;
Lee, TH .
IEEE 1998 CUSTOM INTEGRATED CIRCUITS CONFERENCE - PROCEEDINGS, 1998, :49-52
[18]   Jitter and phase noise in ring oscillators [J].
Hajimiri, A ;
Limotyrakis, S ;
Lee, TH .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1999, 34 (06) :790-804
[19]  
Helstrom C., 1984, PROBABILITY STOCHAST
[20]   An algorithmic introduction to numerical simulation of stochastic differential equations [J].
Higham, DJ .
SIAM REVIEW, 2001, 43 (03) :525-546