How to obtain a reliable structural characterization of polished graphitized carbons by Raman microspectroscopy

被引:87
作者
Ammar, M. R. [1 ,2 ,3 ]
Rouzaud, J. -N. [3 ]
机构
[1] CNRS, CEMHTI, UPR 3079, F-45071 Orleans 2, France
[2] Univ Orleans, Ecole Polytech, F-45072 Orleans, France
[3] Ecole Normale Super, CNRS, UMR 8538, Geol Lab, F-75231 Paris 5, France
关键词
graphitized carbon materials; polishing; Raman microspectroscopy; TRANSMISSION ELECTRON-MICROSCOPY; MICROPROBE SPECTROSCOPY; CARBONACEOUS MATERIAL; AMORPHOUS-CARBON; THIN-SECTIONS; SPECTRA; SCATTERING; FIBERS;
D O I
10.1002/jrs.3014
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
A series of graphitized carbon materials, produced by the pyrolysis of an anthracene-based coke at temperatures ranging from 1600 to 2900 degrees C, were studied by Raman microspectroscopy to assess the applicability of this technique to the particular case of polished carbon materials. The polishing process was shown to change significantly the first-order Raman spectra (D band intensity increase) and therefore to induce unacceptable errors in the characterization of the intrinsic structure of these materials. The deconvolution of Raman spectra, related to the unpolished graphitized carbons at varying temperatures, highlighted a linear relationship between the intensity ratio ID/IG and the G band width. Thus, as the latter appears to be insensitive to the polishing, we highly recommend using it for a reliable assessment of the intrinsic structural disorder of polished carbon materials. Copyright (C) 2011 John Wiley & Sons, Ltd.
引用
收藏
页码:207 / 211
页数:5
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