Two and three slit electron interference and diffraction experiments

被引：10

作者：

Frabboni, Stefano ^{[1
,2
]}

Frigeri, Cesare ^{[3
]}

Gazzadi, Gian Carlo ^{[2
]}

Pozzi, Giulio ^{[4
]}

机构：

[1] Univ Modena & Reggio Emilia, Dept Phys, I-41100 Modena, Italy

[2] CNR Inst Nanosci S3, I-41100 Modena, Italy

[3] CNR IMEM Inst, I-43010 Parma, Italy

[4] Univ Bologna, Dept Phys, I-40127 Bologna, Italy

来源：

AMERICAN JOURNAL OF PHYSICS | 2011年 / 79卷 / 06期

关键词：

FRESNEL INTEGRALS;

D O I：

10.1119/1.3560429

中图分类号：

G40 [教育学];

学科分类号：

040101 ; 120403 ;

摘要：

Current nanotechnology techniques make possible the preparation of slits in the submicrometer range so that electron interference and diffraction experiments can be done even with a conventional electron microscope. If the instrument is also equipped with a field emission source, it is possible to follow almost in real time the transition from the image of the slits to their Fraunhofer pattern through the intermediate Fresnel diffraction images. We discuss our results for the two-slit experiment and illustrate them for the three-slit case. (C) 2011 American Association of Physics Teachers. [DOI: 10.1119/1.3560429]

引用

页码：615 / 618

页数：4

共 16 条

[1] Abramowitz M., 1964, HDB MATH FUNCTIONS, V55
[2] Physical approach to analytic simulation of Fresnel integrals
Anokhov, Sergey
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 2007, 24 (01) : 197 - 203
[3] [Anonymous], OPTICAL PHYS
[4] [Anonymous], 1961, Z. Phys, DOI DOI 10.1007/BF01342460
[5] Born M., 1969, PRINCIPLES OPTICS EL
[6] Crease RP, 2002, PHYS WORLD, V15, P15
[7] Electron microscope calibration for the Lorentz mode
Fazzini, PF
Merli, PG
Pozzi, G
[J]. ULTRAMICROSCOPY, 2004, 99 (2-3) : 201 - 209
[8] Feynman R., 1963, The Feynman Lectures on Physics, VII
[9] Young's double-slit interference experiment with electrons
Frabboni, S.
Gazzadi, G. C.
Pozzi, G.
[J]. AMERICAN JOURNAL OF PHYSICS, 2007, 75 (11) : 1053 - 1055
[10] Four slits interference and diffraction experiments
Frabboni, S.
Frigeri, C.
Gazzadi, G. C.
Pozzi, G.
[J]. ULTRAMICROSCOPY, 2010, 110 (05) : 483 - 487

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