New method for calculating the intensities of X rays and thermal neutrons diffracted in single crystals with defects

被引：0

作者：

Egiazaryan, A. M. ^{[1
]}

Gevorkyan, K. M. ^{[1
]}

Atanesyan, A. K. ^{[1
]}

机构：

[1] Natl Acad Sci Republ Armenia, Inst Appl Problems Phys, Yerevan, Armenia

来源：

CRYSTALLOGRAPHY REPORTS | 2011年 / 56卷 / 03期

关键词：

Neutrons; -; Defects;

D O I：

10.1134/S1063774510051013

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

A new method is proposed to calculate the intensities of X rays and thermal neutrons diffracted in single crystals with defects. This method is based on comparing the dynamic theory of the Bragg diffraction of X rays and thermal neutrons in perfect single crystals with the small-angle scattering theory.

引用

页码：405 / 406

页数：2