共 1 条
A Quick Tool for Assessing Mechanical Stresses in Adhesives between Chip & Substrate
被引:0
作者:
Merzer, Moshe
[1
]
Kantor, Yehuda
[1
]
Rodes, Lior
[1
]
机构:
[1] RAFAEL, IL-3102102 Haifa, Israel
来源:
2015 IEEE INTERNATIONAL CONFERENCE ON MICROWAVES, COMMUNICATIONS, ANTENNAS AND ELECTRONIC SYSTEMS (COMCAS)
|
2015年
关键词:
Shear Stresses;
peeling stresses;
die attachment;
coefficient of thermal expansion;
D O I:
暂无
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Bonding chips to substrates is usually done at high temperatures. After adhesion the system cools down. When the adherends have different thermal properties, the intermediate adhesive becomes subject to large distortions that can cause fracture or failure. Strains and stresses in such configurations can be computed using numerical methods, but they are usually cumbersome. More desirable is an analytic algorithm giving instant albeit approximate results. An analytic formulation that computes quickly stresses within the adhesive is presented together with an example. For this example a simpler analytic formulation is found to give similar results giving support to the primary analysis.
引用
收藏
页数:3
相关论文