共 15 条
[4]
MICRO-TEMPERATURE MEASUREMENTS ON SEMICONDUCTOR-LASER MIRRORS BY REFLECTANCE MODULATION - A NEWLY DEVELOPED TECHNIQUE FOR LASER CHARACTERIZATION
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS,
1993, 32 (12A)
:5514-5522
[7]
MARSH JH, 1993, SEMICOND SCI TECHNOL, V8
[10]
Temperature insensitivity of the Al-free InGaAs(P)/GaAs lasers for lambda=808 and 980 nm
[J].
IN-PLANE SEMICONDUCTOR LASERS: FROM ULTRAVIOLET TO MIDINFRARED,
1997, 3001
:243-253