Design and test of self-checking asynchronous control circuit

被引：0

作者：

Ruan, Jian ^{[1
]}

Wang, Zhiying ^{[1
]}

Dai, Kui ^{[1
]}

Li, Yong ^{[1
]}

机构：

[1] Natl Univ Def Technol, Sch Comp, Changsha, Hunan, Peoples R China

来源：

INTEGRATED CIRCUIT AND SYSTEM DESIGN: POWER AND TIMING MODELING, OPTIMIZATION AND SIMULATION | 2007年 / 4644卷

关键词：

D O I：

暂无

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

The application of asynchronous circuit has been greatly restricted by reason of lacking effective technologies to test. Making use of the self-checking property of asynchronous control circuit, we may preferably solve this problem. In the paper, we put forward an improved, fail-stop David Cell, describe a way of designing self-checking asynchronous control circuits by the direct mapping technique, and propose the testing method for single stuck-at faults. The result shows that self-checking counterpart can be tested at normal operation speed and the area overhead is acceptable.

引用

页码：320 / +

页数：3

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