Noncontact scanning nonlinear dielectric microscopy imaging of TiO2(110) surfaces

被引:3
|
作者
Kin, Nobuhiro [1 ]
Cho, Yasuo [1 ]
机构
[1] Tohoku Univ, Elect Commun Res Inst, Aoba Ku, Sendai, Miyagi 9808577, Japan
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2010年 / 28卷 / 03期
关键词
annealing; dielectric polarisation; electric moments; permittivity; scanning tunnelling microscopy; surface topography; titanium compounds; wide band gap semiconductors;
D O I
10.1116/1.3427661
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The authors simultaneously observed the typical topography and local electric dipole moment distribution of Ti atoms on a TiO2(110) 1x1 structure using noncontact scanning nonlinear dielectric microscopy (NC-SNDM). The upward polarization observed in polarization distribution images implies that the topography determined from the higher-order nonlinear dielectric constant signals is that of Ti4+. They also have examined the difference between the images formed by NC-SNDM and scanning tunneling microscopy. To acquire atomic resolution images using NC-SNDM, it was found that higher annealing temperatures were required. (C) 2010 American Vacuum Society. [DOI: 10.1116/1.3427661]
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页数:6
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