A Fault-Tolerant Single-Phase Grid-Connected Inverter Topology With Enhanced Reliability for Solar PV Applications

被引:64
作者
Kumar, V. V. S. Pradeep [1 ]
Fernandes, Baylon G. [1 ]
机构
[1] Indian Inst Technol, Dept Elect Engn, Bombay 400076, Maharashtra, India
关键词
Device faults; dv/dt triggering of TRIACs; fault-tolerant topology; insulated-gate bipolar transistor (IGBT); Markov reliability model; mean time to failure (MTTF); pulse width modulation (PWM); redundant leg; reliability; MOTOR DRIVE; CONVERTERS; FAILURE; DESIGN;
D O I
10.1109/JESTPE.2017.2687126
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Reliability is an essential requirement for a grid-connected Photovoltaic (PV) system, especially in remote military secured areas, which are difficult to access for the purpose of maintenance. However, the reliability of inverters used in the PV system is mainly affected due to the vulnerability of power semiconductor devices to failure. To improve the reliability of inverters, several fault-tolerant topologies are proposed in the literature. A redundant leg is used in most of these topologies to incorporate redundancy in the inverter operation. However, these topologies require an additional leg and four TRIACs, which increase the device count, and hence are not cost-effective. In this paper, a single-phase fault-tolerant inverter topology is proposed, which does not use the redundant leg and achieves the fault-tolerant feature with minimal device count. Moreover, the reliability of the proposed topology is calculated to be more than that of the redundant leg-based topologies. The operation of the proposed topology is explained under various device fault conditions, and validated through simulation and experimental studies. Finally, the reliability of the proposed topology is evaluated using the Markov reliability model.
引用
收藏
页码:1254 / 1262
页数:9
相关论文
共 30 条
[1]  
[Anonymous], 2006, APPL RANDOM PHASE CR
[2]   A Failure-Detection Strategy for IGBT Based on Gate-Voltage Behavior Applied to a Motor Drive System [J].
Antonio Rodriguez-Blanco, Marco ;
Claudio-Sanchez, Abraham ;
Theilliol, Didier ;
Gerardo Vela-Valdes, Luis ;
Sibaja-Teran, Pedro ;
Hernandez-Gonzalez, Leobardo ;
Aguayo-Alquicira, Jesus .
IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, 2011, 58 (05) :1625-1633
[3]  
Brinzei N., 2014, P IEEE IND APPL SOC, P1
[4]   Selected failure mechanisms of modern power modules [J].
Ciappa, M .
MICROELECTRONICS RELIABILITY, 2002, 42 (4-5) :653-667
[5]   A Unified Approach to Reliability Assessment of Multiphase DC-DC Converters in Photovoltaic Energy Conversion Systems [J].
Dhople, Sairaj V. ;
Davoudi, Ali ;
Dominguez-Garcia, Alejandro D. ;
Chapman, Patrick L. .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2012, 27 (02) :739-751
[6]   Fault tolerant ac-dc-ac single-phase to three-phase converter [J].
dos Santos, E. C., Jr. ;
Jacobina, C. B. ;
Dias, J. A. A. ;
Rocha, N. .
IET POWER ELECTRONICS, 2011, 4 (09) :1023-1031
[7]   Fault-Tolerant Voltage Source Inverter for Permanent Magnet Drives [J].
Errabelli, Rammohan Rao ;
Mutschler, Peter .
IEEE TRANSACTIONS ON POWER ELECTRONICS, 2012, 27 (02) :500-508
[8]  
Flury G., 2009, P 13 EUR C POW EL AP, P1
[9]  
He JB, 2016, APPL POWER ELECT CO, P1065, DOI 10.1109/APEC.2016.7468002
[10]  
IGBT, 2007, IKW08T120 DAT