In situ AFM observation of domain switching and electrically induced fatigue cracking in BaTiO3 single crystal

被引：26

作者：

Wang, F ^{[1
]}

Su, YJ ^{[1
]}

He, JY ^{[1
]}

Qiao, LJ ^{[1
]}

Chu, WY ^{[1
]}

机构：

[1] Univ Sci & Technol Beijing, Dept Mat Phys, Beijing 100083, Peoples R China

来源：

SCRIPTA MATERIALIA | 2006年 / 54卷 / 02期

关键词：

BaTiO3; atomic force microscope; domain switching; electrically induced fatigue cracking;

D O I：

10.1016/j.scriptamat.2005.09.036

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Domain switching and electrically induced fatigue cracking in BaTiO3 single crystal have been studied by in situ atomic force microscopy. The results show that an alternating electric field generates a random domain switching instead of a cyclic domain switching and an arrest crack is re-initiated by both positive and negative electric field. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

引用

页码：201 / 205

页数：5

共 29 条

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