In situ AFM observation of domain switching and electrically induced fatigue cracking in BaTiO3 single crystal

被引：26
|
作者：
Wang, F [1 ]
Su, YJ [1 ]
He, JY [1 ]
Qiao, LJ [1 ]
Chu, WY [1 ]
机构：
[1] Univ Sci & Technol Beijing, Dept Mat Phys, Beijing 100083, Peoples R China
来源：
SCRIPTA MATERIALIA | 2006年 / 54卷 / 02期
关键词：
BaTiO3; atomic force microscope; domain switching; electrically induced fatigue cracking;
D O I：
10.1016/j.scriptamat.2005.09.036
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
Domain switching and electrically induced fatigue cracking in BaTiO3 single crystal have been studied by in situ atomic force microscopy. The results show that an alternating electric field generates a random domain switching instead of a cyclic domain switching and an arrest crack is re-initiated by both positive and negative electric field. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
引用
收藏
页码：201 / 205
页数：5
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